Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
From 5G deployments to Wi-Fi 6E to expanding IoT infrastructure, engineers must design SoCs, chipsets, and user equipment ...
This is the last article in a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on ATE performance requirements. The first article, which ...
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